摘要

An analytical study of a one-dimensional photonic crystal with a defect has been presented. It is found that omni-directional reflection (with cent percent reflectivity) range of a dielectric multilayered structure can be enhanced by introducing a defect in the conventional photonic crystal (PC). In the present communication, we study the omnidirectional reflection in visible and infrared region. We choose the Si/SiO(2) multilayer system for our study. It is found that introduction of a single defect in the structure considered is sufficient to increase omni-directional reflection band widths.

  • 出版日期2010-1