A logical explanation of structurally unfit X-ray diffraction peaks in nanoferroelectrics

作者：Dudhe C M^*; Sakhare B K; Panchbhai S S; Khambadkar S J; Dhoke N V; Chaudhari C P; Palikundwar U A

来源：Bulletin of Materials Science, 2018, 41(1): UNSP 24.

DOI：10.1007/s12034-017-1528-4

• X-ray diffraction
• domains
• ferroelectrics
• nanoparticles
• transmission electron microscopy

In the present paper we suggest the cause and solution of some unidentified X-ray diffraction (XRD) peaks in ferroelectric nanoparticles. Indeed, a relationship between the structurally unfit XRD peaks and domains in the ferroelectric nanoparticles is suggested. BaTiO3, PbTiO3 and Sr0.5Ba0.5Nb2O6 nanoparticles were used as trial samples. Diffraction of X-rays by domain grating was considered for the occurrence of unfit peaks. It was found that domain widths corresponding to some structurally unfit minor peaks of all three trail samples show good agreement to the values estimated from the transmission electron microscopy images. The study can be used to estimate the width of nanodomains (within 5-10 angstrom) in ferroelectric nanoparticles. Thus, the study seems to be highly important for the advancement of nanoferroelectricity.

• 出版日期2018-2