Dithering Loopback-Based Prediction Technique for Mixed-Signal Embedded System Specifications

作者：Kim Byoungho^*

来源：IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 2016, 63(2): 121-125.

DOI：10.1109/TCSII.2015.2482419

• Analog-to-digital converter (ADC)
• digital-toanalog converter (DAC)
• loopback test
• mixed-signal testing

Lower cost test solutions are required to overcome high test cost issue of conventional characterization for the mixed-signal circuits, which is primarily caused by test equipment cost. This brief proposes a cost-effective self-characterization technique that accurately predicts the harmonics of individual mixed-signal circuits by dithering a loopback path with Gaussian-distributed noise. A set of scale factors is applied to the dithered root-mean-square noise. The different scale factors yield a corresponding change in the harmonic magnitudes of the loopback responses. Based on this, we derive a precise nonlinear loopback behaviormodel to quantitatively identify the harmonics of a device under test. The results show that the proposed method can be used for practical characterization.

• 出版日期2016-2