A symmetrical stretching stage for electrical atomic force microscopy

作者：Wielgoszewski Grzegorz; Moczala Magdalena; Orlowska Karolina^*; Sowka Piotr; Cao Wenzhe; Wagner Sigurd; Gotszalk Teodor

来源：Measurement, 2016, 87: 185-188.

DOI：10.1016/j.measurement.2016.03.031

• Sample stretching
• Atomic force microscopy
• Kelvin probe force microscopy

We present a remotely-controlled device for sample stretching, designed for use with atomic force microscopy (AFM) and providing electrical connection to the sample. Such a device enables nanoscale investigation of electrical properties of thin gold films deposited on polydimethylsiloxane (PDMS) substrate as a function of the elongation of the structure. Stretching and releasing is remotely controlled with use of a dc actuator. Moreover, the sample is stretched symmetrically, which gives an opportunity to perform AFM scans in the same site without a time-consuming finding procedure. Electrical connections to the sample are also provided, enabling Kelvin probe force microscopy (KPFM) investigations. Additionally, we present results of AFM imaging using the stretching stage.

• 出版日期2016-6