Note: An online testing method for lifetime projection of high power light-emitting diode under accelerated reliability test

作者：Chen Qi; Chen Quan; Luo Xiaobing^*

来源：Review of Scientific Instruments, 2014, 85(9): 096111.

DOI：10.1063/1.4896352

In recent years, due to the fast development of high power light-emitting diode (LED), its lifetime prediction and assessment have become a crucial issue. Although the in situ measurement has been widely used for reliability testing in laser diode community, it has not been applied commonly in LED community. In this paper, an online testing method for LED life projection under accelerated reliability test was proposed and the prototype was built. The optical parametric data were collected. The systematic error and the measuring uncertainty were calculated to be within 0.2% and within 2%, respectively. With this online testing method, experimental data can be acquired continuously and sufficient amount of data can be gathered. Thus, the projection fitting accuracy can be improved (r(2) = 0.954) and testing duration can be shortened.

• 出版日期2014-9
• 单位武汉纺织大学; 华中科技大学