A compact combined ultrahigh vacuum scanning tunnelling microscope (UHV STM) and near-field optical microscope

作者：Woolley R A J^*; Hayton J A; Cavill S; Ma Jin; Beton P H; Moriarty P

来源：Measurement Science and Technology, 2008, 19(4): 045301.

DOI：10.1088/0957-0233/19/4/045301

• scanning tunnelling microscopy
• near-field scanning microscopy and spectroscopy
• metallic surfaces
• semiconductor surfaces

We have designed and constructed a hybrid scanning near-field optical microscope (SNOM)-scanning tunnelling microscope (STM) instrument which operates under ultrahigh vacuum (UHV) conditions. Indium tin oxide (ITO)-coated fibre-optic tips capable of high quality STM imaging and tunnelling spectroscopy are fabricated using a simple and reliable method which foregoes the electroless plating strategy previously employed by other groups. The fabrication process is reproducible, producing robust tips which may be exchanged under UHV conditions. We show that controlled contact with metal surfaces considerably enhances the STM imaging capabilities of fibre-optic tips. Light collection (from the cleaved back face of the ITO-coated fibre-optic tip) and optical alignment are facilitated by a simple two-lens arrangement where the in-vacuum collimation/collection lens may be adjusted using a slip-stick motor. A second in-air lens focuses the light (which emerges from the UHV system as a parallel beam) onto a cooled CCD spectrograph or photomultiplier tube. The application of the instrument to combined optical and electronic spectroscopy of Au and GaAs surfaces is discussed.

• 出版日期2008-4