An open-ended substrate integrated waveguide probe for detection and sizing of surface cracks in metals

作者：Mazlumi F; Gharanfeli N; Sadeghi S H H^*; Moini R

来源：NDT & E International, 2013, 53: 36-38.

DOI：10.1016/j.ndteint.2012.10.004

• Microwave
• Waveguide
• Cracks
• Sizing

This paper describes the development of a novel microwave probe system for detection and sizing of surface cracks in metals. The probe, which is based on the substrate integrated waveguide (SIW) technology, consists of five parts, namely, a microwave oscillator, an envelope detector, a microstrip line, a transition section, and an open-ended SIW. To evaluate the performance of the probe, theoretical and experimental results are presented for the scans of two metallic specimens containing long surface cracks. It is shown that the SIW probe is capable of detecting and sizing surface cracks of a few millimeters deep while being relatively compact and light as compared to the conventional open-ended rectangular waveguide probes.

• 出版日期2013-1