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摘要
Polycrystalline CdTe films have been produced on various substrates (glass, ITO-coated glass, sapphire, and microtextured silicon) by quasi-closed space growth, and their structural perfection and surface morphology have been studied by optical microscopy and scanning electron microscopy. Using an energy dispersive X-ray spectrometer and the scanning electron microscope, we have obtained the X-ray emission spectra of the CdTe films and determined their elemental composition. The morphological features of the films have been investigated and the cadmium-to-tellurium atomic ratio in the films has been determined experimentally.
- 出版日期2013-4
