科研之友
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摘要
A simple expression for the yield strength of a thin polycrystalline film attached to a substrate and with a passivated layer has been derived from a relationship between stress work for dislocation moving and strain energy. It is shown that, the yield strength of a polycrystalline film is determined by two affecting factors (orientation of grains and type of dislocations) and three strengthening factors ( passivated layer strengthening, substrate strengthening, and grain-size strengthening). Predictions from the expression are in agreement with reported experimental results. This shows that the model is reasonable.
