Determination of residual strain by combining EBSD and DIC techniques

作者：Kuo Jui Chao^*; Wang Han Hong

来源：International Journal of Materials and Product Technology, 2010, 37(3-4): 328-337.

DOI：10.1504/IJMPT.2010.031432

• residual strain
• electron diffraction
• EBSD
• electron back-scatter diffraction
• DIC
• digital image correlation

Electron Back-Scatter Diffraction (EBSD) can be applied to determine lattice defect and local strain distortion. The strain components were obtained with the help of the shifting of zone axis in Kikuchi patterns generated from EBSD. The displacement of zone axis in Kikuchi pattern was determined by using Digital Image Correlation (DIC) method, which provides a great resolution down to 0.01 pixels, which means the ideal sensitivity to be similar to 3.6 x 10(-5) However, the errors of calculating the residual strain can result from the image quality of Kikuchi patterns, Such as the formation of dark areas in the Kikuchi patterns and the background noise.

• 出版日期2010