A rotating scan scheme for automatic outlier removal in laser scanning of reflective surfaces

作者：Wang Yutao; Feng Hsi Yung^*

来源：International Journal of Advanced Manufacturing Technology, 2015, 81(1-4): 705-716.

DOI：10.1007/s00170-015-7209-9

• Laser scanning
• Outlier removal
• Rotating scan
• Scanning orientation
• Reflective surface

Outlier removal is a fundamental and critical data processing task so as to ensure quality of scanned point clouds and their applications. Point clouds collected from reflective surfaces are often contaminated by extensive outliers. Existing outlier removal methods usually rely on analyzing the point cloud data only without the knowledge of outlier formation and the information of the scanning operation. They generally show limited effectiveness in detecting the extensive outliers. This paper aims to utilize the outlier formation characteristics in relation to scanning orientations in order to develop an effective outlier removal approach. It is observed that the regions where outliers occur are generally dependent on the scanning orientation whereas ordinary scanned surface points are almost invariant regardless of the scanning orientation. An outlier removal method based on a rotating scan scheme is proposed to detect such view-dependent outliers. The key feature of the rotating scan scheme is to utilize the scanning orientation information together with the raw scanned point clouds to reliably detect outliers. Numerous case studies have been conducted to demonstrate the effectiveness of the proposed rotating scan scheme in comparison with various existing methods.

• 出版日期2015-10