Atomic Imaging of Phase Transitions and Morphology Transformations in Nanocrystals

作者:van Huis Marijn A*; Young Neil P; Pandraud Gregory; Creemer J Fredrik; Vanmaekelbergh Daniel; Kirkland Angus I; Zandbergen Henny W
来源:Advanced Materials, 2009, 21(48): 4992-+.
DOI:10.1002/adma.200902561

摘要

A newly developed SiN microhotplate allows specimens to be studied at temperatures up to 1000 K at a resolution of 100 picometer (see image). Aberration-corrected transmission electron microscopy has become a commonplace tool to investigate stable crystals; however, imaging transient nanocrystals is much more demanding. Morphological transformations in gold nanoparticles and layer-by-layer sublimation of PbSe nanocrystals is imaged with atomic resolution.

  • 出版日期2009-12-28