Degradation of high-power semiconductor quantum-well lasers

作者:Koval O I*; Rzhanov A G; Solovyev G A
来源:Physics of Wave Phenomena, 2013, 21(4): 287-290.
DOI:10.3103/S1541308X13040092

摘要

A mechanism of degradation of semiconductor quantum-well lasers with a stripe contact more than 50 A mu m wide is proposed. This mechanism implies formation of several lasing channels at a carrier ambipolar diffusion length smaller than the contact width. The carrier diffusion length decreases with time due to the increase in the number of defects; as a result, the number of lasing channels increases and lasing spectrum is filled. The shape of the lasing spectrum can be used to predict the laser service life.

  • 出版日期2013-10

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