摘要
Rutile iridium dioxide (IrO2) surfaces were studied by cross-sectional scanning tunneling microscopy (XSTM). Atomically flat surfaces prepared by in situ ultra high vacuum cleaving of crystalline platelets of thicknesses < 50 mu m were successfully demonstrated. In addition to (110) surface, several vicinal planes, e.g., (120), (130) and similar to (891), were also examined. The cleaved planes are close to bulk-terminated surfaces with predominant [001]-oriented bridge oxygen rows. Unlike TiO2, bright oxygen rows are imaged and oxygen defects appear as dim species. Our studies show that XSTM is a viable technique to study oxide surfaces that are otherwise difficult to prepare.
- 出版日期2007-6-15