Efficient testing of multi-output combinational cells in nano-complementary metal oxide semiconductor integrated circuits

作者：Valenti Lorenzo^*; Dalpasso Marcello; Favalli Michele

来源：IET Computers and Digital Techniques, 2014, 8(2): 83-89.

DOI：10.1049/iet-cdt.2013.0077

This study addresses the problem of efficient fault simulation and test generation in circuits using multi-output combinational logic cells. A symbolic fault simulation algorithm is proposed to exploit bit-level parallelism in order to represent the propagation of the output value of faulty cells throughout the circuit, thus accounting for different faulty behaviours in a single simulation step. A satisfiability (SAT)-based test generation procedure is also provided and it early discovers sets of undetectable behaviours. Results for a set of combinational benchmarks show the feasibility of the proposed approach.

• 出版日期2014-3