摘要
We have studied down-conversion photoluminescence (PL) from (Ce, Yb) co-doped "oxygen rich" silicon oxide films prepared by sputtering and annealing. The Ce3+ similar to 510nm PL is sensitive to the Ce concentration of the films and is much stronger for 3 at. % Ce than for 2 at. % Ce after annealing at 1200 degrees C. The PL emission and excitation spectroscopy results indicate that the excitation of Yb3+ is mainly through an energy transfer from Ce3+ to Yb3+, oxide defects also play a role in the excitation of Yb3+ after lower temperature (similar to 800 degrees C) annealing. The Ce3+ 510 nm photon excites mostly only one Yb3+ 980nm photon. Temperature-dependent PL measurements suggest that the energy transfer from Ce3+ to Yb3+ is partly thermally activated.