Direct correlation between reliability and pH changes of phosphors for white light-emitting diodes

作者:Choi Minho; Kim Ki Hyun; Yun Changhun; Koo Dai Hyoung; Bin Song Sang; Kim Jae Pil*
来源:Microelectronics Reliability, 2014, 54(12): 2849-2852.
DOI:10.1016/j.microrel.2014.07.141

摘要

The reactivity of phosphor with water was investigated by measuring pH change, and the results are compared with long-term reliability test results as well as scanning electron microscope (SEM) and inductively coupled plasma optical emission spectroscopy (ICP-OES) results. We found that the slope of pH change strongly depends on phosphor composition and represents a long-term reliability test result induced by phosphor in an LED package.

  • 出版日期2014-12