Direct Measurement of the Growth Mode of Graphene on SiC(0001) and SiC(000(1)over-bar)

作者:Hannon J B*; Copel M; Tromp R M
来源:Physical Review Letters, 2011, 107(16): 166101.
DOI:10.1103/PhysRevLett.107.166101

摘要

We have determined the growth mode of graphene on SiC(0001) and SiC(000 (1) over bar) using ultrathin, isotopically labeled Si(13)C "marker layers" grown epitaxially on the Si(12)C surfaces. Few-layer graphene overlayers were formed via thermal decomposition at elevated temperature. For both surface terminations (Si face and C face), we find that the (13)C is located mainly in the outermost graphene layers, indicating that, during decomposition, new graphene layers form underneath existing ones.

  • 出版日期2011-10-11

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