摘要

The paper presents the construction and application of multiple classifiers to increase the accuracy of the fault detection module in the diagnostic task. The structure of the ensemble of classifiers is presented and the applied voting mechanisms explained. Methods of storing knowledge in the intelligent diagnostic systems are introduced and their taxonomy provided. Next, the selected algorithms implemented in the fault detection operation are briefly described. Problems with the practical implementation of the proposed solution are considered. The scheme is used to detect faults in the analog part of the MEMS accelerometer. The paper is concluded with the possible prospects for the proposed scheme.

  • 出版日期2015-5