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摘要
Edge illumination (EI) is a promising X-ray phase contrast imaging (XPCI) technique and is expected to translate XPCI into practical applications with laboratory X-ray sources. However, traditional double-mask EI setup requires two acquisitions for extracting phase and absorption information. Although the latest single-mask EI setup allows phase retrieval with single-shot, it requires a nearly ideal detector point spread PSF). In this paper, an alternative EI setup is proposed, which remains double-mask but requires only a single-shot. It can implement single-shot XPCI and relax the detector requirements. Numerical calculations are carried out to compare the characteristics of the double- and single-mask EI setup and the proposed setup. The performance of this setup with different illumination conditions is evaluated theoretically. The results suggest that the proposed setup is less affected by the detector PSF compared to the single-mask EI setup and therefore has higher contrast and contrast-to-noise ratio. Phase retrieval can be implemented by this setup with a single-shot, which helps to simplify the operations and eliminate the potential errors in the double-mask EI setup. A narrow illumination width contributes to the contrast but adversely affects the radiation utilization efficiency, and some appropriate trade-offs should be selected according to the practical applications and experimental conditions. On the basis of this setup, the extraction of the quantitative phase and absorption information was also conducted by numerical calculation. Published by AIP Publishing.
- 出版日期2018-10-28
- 单位兰州大学
