Degradation of AlInGaP red LEDs under drive current and temperature accelerated life tests

作者：Vazquez M^*; Nunez N; Nogueira E; Borreguero A

来源：Microelectronics Reliability, 2010, 50(9-11): 1559-1562.

DOI：10.1016/j.microrel.2010.07.057

AlInGaP LEDs are widely used in illumination applications as automotive and signalization due their low consumption and high durability. In order to verify the high durability data it is necessary to consider not only catastrophic failures but also degradation. In this work LEDs degradation at different temperature and drive current accelerated tests have been analyzed. In all the tests we have carried out an exponential degradation trend have been observed. Temperature and drive current influence in degradation rate and reliability have been evaluated.

• 出版日期2010-11