Application of support vector machine to reliability evaluation of small-sample IC

作者：Zou, Xin-Yao; Yao, Ruo-He^*

来源：Journal of South China University of Technology(Natural Science Edition), 2009, 37(1): 23-26.

• Electronic device
• Evaluation results
• Gate oxide
• Least square methods
• Life distribution
• Optimal kernels
• Reliability Evaluation
• Reliability parameters

It is difficult to obtain accurate evaluation results in dealing with small-sample electronic devices by using the traditional methods in practice, because the small sample can not accord with the large sample-based hypothesis of the traditional methods. In order to solve this problem, this paper proposes a reliability evaluation method of small-sample electronic devices based on the support vector machine (SVM). In this method, after the training of failure time of electronic devices, the optimal kernel function and parameters are selected to construct a SVM model, and the reliability parameters are evaluated according to the straight line fitted by the SVM model. Evaluated results of the life distribution of a gate oxide indicate that the proposed method is more accurate than the least square method based on large sample.

• 出版日期2009-1
• 单位华南理工大学