Analog circuit intelligent fault diagnosis based on PCA and OAOSVM

作者：Guo Ke^*; Zhu Yi; San Ye

来源：3rd International Conference on Manufacturing Science and Engineering (ICMSE 2012), 2012-03-27 to 2012-03-29.

DOI：10.4028/www.scientific.net/AMR.468-471.802

• One-against-One Support Vector Machine
• Principal Component Analysis
• Fault Diagnosis
• Analog Circuit

Fault diagnosis of analog circuits is essential for guaranteeing the reliability and maintainability of electronic systems. Analog circuit fault diagnosis can be regarded as a pattern recognition issue and addressed by one-against-one SVM. In order to obtain a good SVM-based fault classifier, the principal component analysis technique is adopted to capture the major fault features. The extracted fault features are then used as the inputs of SVM to solve fault diagnosis problem. The effectiveness of the proposed method is verified by the experimental results.

• 出版日期2012
• 单位哈尔滨工业大学