科研之友
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摘要
A computational system employed in safety-critical applications typically has reliability as a primary concern. Thus, the designer focuses on minimizing the device radiation-sensitive area, often leading to performance degradation. In this article, we present a mathematical model to evaluate system reliability in spatial (i.e., radiation-sensitive area) and temporal (i.e., performance) terms and prove that minimizing radiation sensitive area does not necessarily maximize application reliability. To support our claim, we present an empirical counterexample where application reliability is improved even if the radiation-sensitive area of the device is increased. An extensive radiation test campaign using a 28nm commercial-off-the-shelf ARM-based SoC was conducted, and experimental results demonstrate that, while executing the considered application at military aircraft altitude, the probability of executing a two-year mission workload without failures is increased by 5.85% if L1 caches are enabled (thus increasing the radiation-sensitive area) when compared to no cache level being enabled. However, if both L1 and L2 caches are enabled, the probability is decreased by 31.59%.
- 出版日期2016
