科研之友
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摘要
Microscopists have always pursued the development of an instrument that combines topography and materials properties analyses at the highest resolution. The measurement of the tiny amount of energy dissipated by a vibrating tip in the proximity of the sample surface has provided atomic force microscopes with a robust and versatile method to determine the morphology and the compositional variations of surfaces in their natural environment. Applications in biology, polymer science and microelectronics illustrate the potential of phase-imaging force microscopy for nanoscale analysis.
- 出版日期2007-6
