摘要

Image data can be acquired from a product surface in real time by image sensor systems in chemical plants. For quality determination based on these image datasets, effective texture classification methodology is essential to handle highly dimensional images and to extract quality-related information from these product surface images.
Wavelet texture analysis is useful for reducing the dimension and extracting textural information from images. Although wavelet texture analysis extracts only textural characteristics from images, the extracted features still contain unnecessary information for classification. The texture analysis method can be improved by retaining only class-dependent features and removing common features. In previous works, best basis and local discriminant basis are the most popular techniques for selecting an important basis from the wavelet packet basis. However, feature selection based on wavelet texture analysis has been studied for texture classification. Because previous methods are designed for wavelet coefficients with features for analysis, their performance is poor with wavelet texture analysis.
We propose a novel texture classification methodology for quality determination based on feature selection using wavelet texture analysis. The proposed methodology applies the sequential forward floating selection (SFFS) algorithm as a feature selection strategy to select discriminating wavelet signatures using wavelet texture analysis. The proposed methodology is validated through quality determination for industrial steel surfaces. The results show that the proposed method has fewer classification errors with fewer number of features than previous methods.

  • 出版日期2011-12-1