Magnetic Scanning Probe Calibration Using Graphene Hall Sensor

作者：Panchal Vishal; Iglesias Freire Oscar; Lartsev Arseniy; Yakimova Rositza; Asenjo Agustina; Kazakova Olga^*

来源：IEEE Transactions on Magnetics, 2013, 49(7): 3520-3523.

DOI：10.1109/TMAG.2013.2243127

• Epitaxial graphene
• Hall sensor
• Kelvin probe force microscopy (KPFM)
• magnetic probe calibration

Magnetic force microscopy (MFM) offers a unique insight into the nanoscopic scale domain structures of magnetic materials. However, MFM is generally regarded as a qualitative technique and, therefore, requires meticulous calibration of the magnetic scanning probe stray field (B-probe) for quantitative measurements. We present a straightforward calibration of B-probe using scanning gate microscopy on epitaxial graphene Hall sensor in conjunction with Kelvin probe force microscopy feedback loop to eliminate sample-probe parasitic electric field interactions. Using this technique, we determined B-probe similar to 70 mT and similar to 76 mT for probes with nominal magnetic moment similar to 1 x 10(-13) and > 3 x 10(-13) emu, respectively, at a probe-sample distance of 20 nm.

• 出版日期2013-7