A resistance matching based self-testable current-mode R-2R digital-to-analog converter

作者：Yuan Jun^*; Tachibana Masayoshi

来源：IEICE Electronics Express, 2013, 10(23): 20130753.

DOI：10.1587/elex.10.20130753

• built-in self-test
• resistance matching
• design for testability
• digital-to-analog converter

This paper presents a resistance matching based self-testable current-mode R-2R Digital-to-Analog Converter (DAC). The Built-In Self-Test (BIST) circuits are employed to observe the current redistributions in the resistance matching branches converted from the R-2R network in the DAC, and then the redistributed currents are transformed to voltages to detect the R-2R network with extra Design For Testability (DFT) circuits. The circuit-level simulation of the proposed BIST system are presented to demonstrate the feasibility with fault coverage of 96% for R-2R network and 82.6% for the Operational Amplifier (OpAmp), and area overhead of approximately 6%.

• 出版日期2013
• 单位重庆邮电大学