New Weighted Time Lag Method for the Analysis of Random Telegraph Signals

作者：Martin Martinez Javier^*; Diaz Javier; Rodriguez Rosana; Nafria Montserrat; Aymerich Xavier

来源：IEEE Electron Device Letters, 2014, 35(4): 479-481.

DOI：10.1109/LED.2014.2304673

• Random telegraph signals
• noise
• CMOS
• parameter extraction
• characterization

A new method for the characterization of random telegraph signals (RTSs) is presented. The method, which is based on the time lag plot, is illustrated using Monte Carlo generated RTS traces and applied to identify the contribution of defects in multilevel RTS measured in a pMOS transistor. The results show that the new method provides a powerful and easily implementable technique to obtain the parameters of the defects responsible of multilevel RTS, even when the background noise is relevant.

• 出版日期2014-4