Atomic-layer-resolved analysis of surface magnetism by diffraction spectroscopy

作者：Matsui Fumihiko^*; Matsushita Tomohiro; Daimon Hiroshi

来源：Journal of Electron Spectroscopy and Related Phenomena, 2010, 181(2-3): 150-153.

DOI：10.1016/j.elspec.2010.02.015

• Surface magnetism
• Auger electron diffraction
• X-ray absorption spectroscopy
• Magnetic circular dichroism
• Subsurface

X-ray absorption near edge structure (XANES) and X-ray magnetic circular dichroism (XMCD) measurements by Auger-electron-yield detection are powerful analysis tools for the electronic and magnetic structures of surfaces, but all the information from atoms within the electron mean-free-path range is summed into the obtained spectrum. In order to investigate the electronic and magnetic structures of each atomic layer at subsurface, we have proposed a new method, diffraction spectroscopy, which is the combination of X-ray absorption spectroscopy and Auger electron diffraction (AED). From a series of measured thickness dependent AED patterns, we deduced a set of atomic-layer-specific AED patterns arithmetically. Based on these AED patterns, we succeeded in disentangling obtained XANES and XMCD spectra into those from different atomic layers.

• 出版日期2010-8