摘要
We demonstrate two Sb-based alloys, Ga(25)Te(8)Sb(67) and Ga(18)Te(12)Sb(70), that have a crystallization temperature above 245 degrees C and activation energy of crystallization greater than 5 eV, for phase-change memory application. The temperature for 10 year data retention reaches 183 and 210 degrees C for Ga(18)Te(12)Sb(70) and Ga(25)Te(8)Sb(67), respectively. Test cells made of alloy Ga(25)Te(8)Sb(67) show similar memory switching behavior at pulse widths of 500-20 ns. Compared with the benchmark chalcogenide Ge(2)Sb(2)Te(5), the two antimonide alloys possess much improved thermal stability for applications in phase-change memory.
- 出版日期2010-10
- 单位清华大学