科研之友
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摘要
We report the simulation and measurement results of near field spatial scattering spectra around nanoparticles. Our measurement and simulations results have indicated that Parametric Indirect Microscopic Imaging can image the near field spatial scattering to a much larger distance from the scattering source of the particle under measurement whereas this part of spatial scattering was lost in the conventional microscopy. Both FDTD modeling and measurement provided evidence that parameters of indirect optical wave vector have higher sensitivity to near field scattering.
