A multilayer data copy test data com pression scheme for reducing shifting-in power for multiple scan design

作者：Lin Shih Ping^*; Lee Chung Len; Chen Jwu E; Chen Ji Jan; Luo Kun Lun; Wu Wen Ching

来源：IEEE Transactions on Very Large Scale Integration Systems, 2007, 15(7): 767-776.

DOI：10.1109/TVLSI.2007.899232

• circuit testing
• low-power testing
• test data compression
• test pattern generation

The random-like filling strategy pursuing high compression for today's popular test compression schemes introduces large test power. To achieve high compression in conjunction with reducing test power for multiple-scan-chain designs is even harder and very few works Were dedicated to solve this problem. This paper proposes and demonstrates a multilayer data copy (MDC) scheme for test compression as well as test power reduction for multiple-scan-chain designs. The scheme utilizes,a decoding buffer, which supports fast loading using previous loaded data, to achieve test data compression and test power reduction at the same time. The scheme can be applied automatic test pattern generation (ATPG)-independently or to be incorporated in an ATPG to generate highly compressible and power efficient test sets. Experiment results on benchmarks show that test sets generated by the scheme had large compression and power saving with only a small area design overhead.

• 出版日期2007-7
• 单位中央民族大学