摘要

On the basis of absorption nature of semiconductors, we present a novel and simple method to determine the band gap energies of semiconductors directly from their absorption spectra at any temperatures, without any fitting processes and restrictions of sample thickness. The key point of the approach is the different dependence of the absorption coefficient derivative on the photon energy at different absorption regions in semiconductors. We first demonstrate and verify the approach by detailed temperature-dependent absorption measurements, combined with photoluminescence measurements and empirical band gap equations for the direct band gap of uniform InAs films, and then extend successfully to the indirect band gap of elemental Ge and to the ternary HgCdTe alloys with composition gradient. Furthermore, we have also shown that our approach can not only evaluate the average band gap energy for ternary semiconductor alloys, but also estimate their composition uniformity to monitor the material quality.