Advanced time-stamped total data acquisition control front-end for MeV ion beam microscopy and proton beam writing

作者：Kivisto Henri^*; Rossi Mikko; Jones Pete; Norarat Rattana****; Puttaraksa Nitipon; Sajavaara Timo; Laitinen Mikko; Hanninen Vaino; Ranttila Kimmo; Heikkinen Pauli; Gilbert Leona; Marjomaki Varpu; Whitlow Harry J

来源：Microelectronic Engineering, 2013, 102: 9-11.

DOI：10.1016/j.mee.2012.02.011

• Front-end
• Microbeam
• FPGA
• Data acquisition
• Time-stamping

Many ion-matter interactions exhibit sub-mu s time dependences such as, fluorophore emission quenching and ion beam induced charge (IBIC). Conventional event-mode MeV ion microbeam data acquisition systems discard the time information. Here we describe a fast time-stamping data acquisition front-end based on the concurrent processing capabilities of a Field Programmable Gate Array (FPGA). The system is intended for MeV ion microscopy and MeV ion beam lithography. The speed of the system (>240,000 events s(-1) for four analogue to digital converters (ADC)) is limited by the ADC throughput and data handling speed of the host computer.

• 出版日期2013-2