Space- and Time-Resolved Mapping of Ionic Dynamic and Electroresistive Phenomena in Lateral Devices

作者:Strelcov Evgheni*; Jesse Stephen; Huang Yen Lin; Teng Yung Chun; Kravchenko Ivan I; Chu Ying Hao; Kalinin Sergei V
来源:ACS Nano, 2013, 7(8): 6806-6815.
DOI:10.1021/nn4017873

摘要

A scanning probe microscopy-based technique for probing local ionic and electronic transport and their dynamic behavior on the 10 ms to 10 s scale is presented. The time-resolved Kelvin probe force microscopy (tr-KPFM) allows mapping of surface potential in both space and time domains, visualizing electronic and ionic charge dynamics and separating underlying processes based on their time responses. Here, tr-KPFM is employed to explore the interplay of the adsorbed surface ions and bulk oxygen vacancies and their role in the resistive switching in a Ca-substituted bismuth ferrite thin film.

  • 出版日期2013-8