Ultralow contact resistivity in annealed titanium edge contacts for multilayered graphene

作者:Ito Kazuyuki; Ogata Takamasa; Sakai Tadashi; Awano Yuji*
来源:Applied Physics Express, 2015, 8(2): 025101.
DOI:10.7567/APEX.8.025101

摘要

The structure dependence and electrical properties of a metal contact with multilayered graphene (MLG) have been investigated. We demonstrate the superiority of end- (or edge-) contact configurations for future three-dimensional (3D) interconnect applications. The contact resistivity of titanium end contacts can be lowered to 7.7 x 10(-8) Omega cm(2) by thermal annealing at 450 degrees C, which is 2 orders of magnitude lower than that of conventional top-contact configurations, and to the best of our knowledge, it is the lowest value ever reported for a pristine MLG. X-ray photoelectron spectroscopy (XPS) measurements revealed the formation of covalent-bonded titanium carbide as an interface layer between the metal layer and MLG.

  • 出版日期2015-2