摘要
Silicon (Si) spheres were prepared by a powder melting method, and their nucrostructures and optical properties were investigated. The lattice constant of the Si spheres increased upon phosphorus (P) diffusion, compared to that before P diffusion. This was attributed to the presence of interstitial P atoms. A fluorine-doped tin oxide (SnOx:F-x) anti-reflection film was then coated on the surface of the Si spheres. Changes in the lattice constant and bandgap of the SnOx:F-y film occurred upon subsequent annealing. This was attributed to changes in the composition of the SnOx:F-y film.
- 出版日期2016