科研之友
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摘要
Reliability modeling of fault-tolerant systems subject to shocks and natural degradation is important yet difficult for engineers, because the two external stressors are often positively correlated. Motivated by the fact that most radiation-induced failures are contributed from these two external stressors, a degradation-shock-based approach is proposed to model the failure process. The proposed model accommodates two kinds of failure modes: hard failure caused by shocks and soft failure caused by degradation. We consider a generalized m- shock model for systems with fault-tolerant design: failure occurs if the time lag between m sequential shocks is less than hours or degradation crosses a critical threshold. An example concerning memory chips used in space is presented to demonstrate the applicability of the proposed model.
