摘要
A novel constrained layout placement approach is proposed to enhance the pulse quenching effect in combinational circuits. This constrained algorithm can enlarge the number of quenching cells and shrink the distance between these cells. Simulation results illustrate that the soft error vulnerabilities are effectively reduced by adopting this novel constrained layout placement algorithm with no area penalty.
- 出版日期2014-3
- 单位中国人民解放军国防科学技术大学