Atomic-scale chemical quantification of oxide interfaces using energy-dispersive X-ray spectroscopy

作者：Lu Ping^*; Xiong Jie; Van Benthem Mark; Jia Quanxi

来源：Applied Physics Letters, 2013, 102(17): 173111.

DOI：10.1063/1.4804184

Atomic-scale quantification of chemical composition across oxide interfaces is important for understanding physical properties of epitaxial oxide nanostructures. Energy-dispersive X-ray spectroscopy (EDS) in an aberration-corrected scanning transmission electron microscope was used to quantify chemical composition across the interface of ferromagnetic La0.7Sr0.3MnO3 and antiferromagnetic BiFeO3 quantum structure. This research demonstrates that chemical composition at atomic columns can be quantified by Gaussian peak-fitting of EDS compositional profiles across the interface. Cation diffusion was observed at both A- and B-sublattice sites; and asymmetric chemical profiles exist across the interface, consistent with the previous studies.

• 出版日期2013-4-29