AlGaN Channel HEMT With Extremely High Breakdown Voltage

作者：Nanjo Takuma^*; Imai Akifumi; Suzuki Yosuke; Abe Yuji; Oishi Toshiyuki; Suita Muneyoshi; Yagyu Eiji; Tokuda Yasunori

来源：IEEE Transactions on Electron Devices, 2013, 60(3): 1046-1053.

DOI：10.1109/TED.2012.2233742

• AlGaN channel high-electron mobility transistor (HEMT)
• breakdown voltage
• high frequency
• high power
• information-communication
• power electronics

Enhanced performance of RF power modules is required in a next-generation information society. To satisfy these requirements, we designed a novel high-electron mobility transistor (HEMT) structure employing wider bandgap AlGaN for a channel layer, which we called AlGaN channel HEMT, and investigated it. The wider bandgap is more effective for higher voltage operation of HEMTs and contributes to the increase of output power in RF power modules. As a result, fabricated AlGaN channel HEMTs had much higher breakdown voltages than those of conventional GaN channel HEMTs with good pinchoff operation and sufficiently high drain current density without noticeable current collapse. Furthermore, specific ON-state resistances of fabricated AlGaN channel HEMTs were competitive with the best values of reported GaN- and SiC-based devices with similar breakdown voltages. These results indicate that the proposed AlGaN channel HEMTs are very promising not only for an information-communication society but also in the power electronics field.

• 出版日期2013-3