A Study on Network Analyzer Self-Calibration using an Arbitrary Device

作者：Chen Chih Jung^*

来源：IEEE Transactions on Instrumentation and Measurement, 2013, 62(9): 2576-2582.

DOI：10.1109/TIM.2013.2258768

• Scattering parameters
• self-calibration
• short-open-load-reciprocal
• thru-attenuator-network
• thru-line-reflect
• vector network analyzer

This paper studies the feasibility of calibrating a vector network analyzer with an arbitrary device serving as a calibration standard. The short-open-load-reciprocal and thru-attenuator-network (TAN) procedures are, respectively, extended to develop short-open-load-device and thru-attenuator-device algorithms. The developed algorithms eliminate the limitations and broaden the applicable range of the thru-open-load-reciprocal and TAN procedures by using the device under test as a transfer standard. To benchmark the developed algorithms against the thru-reflect-line algorithm, experiments are conducted with a nonreciprocal device having theoretically symmetrical reflections. Results of the experiments verify the applicability of the developed algorithms.

• 出版日期2013-9