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摘要
The crystallographic and structural characteristics of GaN tripods and hexapods grown on c-plane sapphire substrates were investigated using synchrotron X-ray scattering and microscopic analysis. The core structure of a GaN hexapod is revealed to be in the zincblende phase with an inversion domain, and a refined crystallographic analysis of tripods and hexapods with synchrotron X-ray scattering shows the existence of the zincblende phase in wurtzite-based protruding nanorods. The atomistic model combined with this crystallographic analysis reveals that the core size of a hexapod is much smaller than the diameters of the protruding nanorods. This refined structural analysis can be utilized in tailoring the opto-electronic characteristics of GaN multipods.
- 出版日期2010-12
