科研之友
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摘要
A new instrument for absolute measurement of hyperspectral and angular reflection is presented. The instrument determines absolute values of angular reflection quantities in a wavelength range from 380 to 780 nm with a 3 nm spectral resolution by using a white source and a CCD-based spectroradiometer. Through uncertainty evaluation, the measurement uncertainty is determined as 1.4%-2.9% (k = 2) for white diffuse material of Spectralon. The gonioreflectometric determination and an integrating-sphere-based reflection measurement traceable to KRISS spectral reflectance scale are compared by determining hemispherical reflectance, which results in agreement in their uncertainties.
- 出版日期2014-9-20
