Hybrid reciprocal space for X-ray diffraction in epitaxic layers

作者：Morelhao Sergio L^*; Domagala Jarek Z

来源：Journal of Applied Crystallography, 2007, 40: 546-551.

DOI：10.1107/S002188980701521X

Even after several decades of systematic usage of X-ray diffraction as one of the major analytical tool for epitaxic layers, the vision of the reciprocal space of these materials is still a simple superposition of two reciprocal lattices: one from the substrate and the other from the layer. In this work, the general theory accounting for hybrid reflections in the reciprocal space of layer/substrate systems is presented. It allows insight into the non-trivial geometry of such reciprocal space as well as into many of its interesting properties. Such properties can be further exploited even on conventional-source X-ray diffractometers, leading to alternative, very detailed and comprehensive analyses of such materials.

• 出版日期2007-6