Using post-breakdown conduction study in a MIS structure to better understand the resistive switching mechanism in an MIM stack

作者：Wu Xing; Pey Kin Leong^*; Raghavan Nagarajan; Liu Wen Hu; Li Xiang; Bai Ping; Zhang Gang; Bosman Michel

来源：Nanotechnology, 2011, 22(45): 455702.

DOI：10.1088/0957-4484/22/45/455702

We apply our understanding of the physics of failure in the post-breakdown regime of high-kappa dielectric-based conventional logic transistors having a metal-insulator-semiconductor (MIS) structure to interpret the mechanism of resistive switching in resistive random-access memory (RRAM) technology metal-insulator-metal (MIM) stacks. Oxygen vacancies, gate metal migration and metal filament formation in the gate dielectric which constitute the chemistry of breakdown in the post-breakdown stage of logic gate stacks are attributed to be the mechanisms responsible for the SET process in RRAM technology. In this paper, we draw an analogy between the breakdown study in logic devices and filamentation physics in resistive non-volatile memory.

• 出版日期2011-11-11
• 单位北京大学; 南阳理工学院