An X-ray diffractometer using mirage diffraction (vol 47, pg 1267, 2014)

作者:Fukamachi Tomoe*; Jongsukswat Sukswat; Ju Dongying; Negishi Riichirou; Hirano Keiichi; Kawamura Takaaki
来源:JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2015, 48(1): 312-312.
DOI:10.1107/S1600576714026028

摘要

Errors in the article by Fukamachi, Jongsukswat, Ju, Negishi, Hirano & Kawamura [] are corrected.

  • 出版日期2015-2