Dislocation structure in AlN films induced by in situ transmission electron microscope nanoindentation (vol 112, 093526, 2012)

作者:Tokumoto Yuki*; Kutsukake Kentaro; Ohno Yutaka; Yonenaga Ichiro
来源:Journal of Applied Physics, 2012, 112(12): 129902.
DOI:10.1063/1.4771927
  • 出版日期2012-12-15

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