摘要

While materials development is promoted by the progress of measurement and analysis techniques, advanced materials can contribute to improving measurement and analysis. Here, fluorescent materials development is reported, mainly on X-ray scintillator YAlO3 (YAP). Investigations included synthesis of the single-phase YAP by the polymerized complex method, film coating, and its application to neutron detection. The YAP:Ce has been put to practical use as a fast scindllator for NaI, which is an example that the advanced material should improve measurement and analysis.

  • 出版日期2015-12

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